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Quality & Inspection

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Quality & Inspection

ZEISS CONTURA G2 RDS

Carl Zeiss Spectrum CMM

  • RDS C5 Probe system
  • Full feature graphic measurement
  • Accuracy up to (1.8 + L/300) μm
  • Calypso 2016 measurement software

Carl Zeiss Spectrum CMM

Carl Ziess O Inspect

Carl Zeiss O INSPECT

  • Scanning probe
  • Optical camera system
  • Full feature graphic measurement
  • Accuracy up to (1.8 + L/300) μm
  • Calypso 2018 measurement software

Carl Zeiss O INSPECT

OPTOMECH VPP-3020 CNC x 2

Optomech Vpp-3020 CNC X2

  • Full Inspection reports
  • Advance SPC software
  • Auto focus & Control of Len’s lighting
  • Measurement of depths
  • Measuring accuracy (3+L/100) Microns
  • SPC report generator and monitoring

Optomech Vpp-3020 CNC x 2

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Carl Zeiss Surfcom Flex 50A

  • Instant Surface finish measurement
  • Skid less and the highest straightness accuracy
  • Precise & accurate
  • Measurement target 0 – 200MM
  • Sits on anti Vibration table

Carl Zeiss Surfcom Flex 50A

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TRIMOS V3 Height gauge x 2

  • Measuring ranges 400 and 700 mm
  • Electronically adjustable measuring force
  • USB Interface
  • Complete probe kit

TRIMOS V3 Height gauge x 2

Keyence IM 7020

Keyence IM 7020

  • Automatic recognition of part position and orientation
  • Fast measurement (multiple parts simultaneously in seconds)
  • Wide range of applications and GD&T tools
  • Versatile programming for in-process and final inspections
  • Accurate and repeatable measurements
  • Ability to record results and create inspection report
  • Depth probe

Keyence IM 7020

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Surfcom Nex – Contour Tracer

  • Best-in-class residual noise (Rz 0) thanks to a low-vibration linear drive
  • Resolution of up to 0.1 nm at a 6.4 µm range and 20 nm at a 1,000 µm range
  • With the optional tracing driver tilting unit it is possible to manually tilt the tracing driver +/-5 degrees

Surfcom Nex – Contour Tracer

ZEISS CONTURA G2 RDS

ZEISS CONTURA G2 RDS

  • scanning of features in all angular positions with VAST XXT on the flexible ZEISS RDS articulating probe

ZEISS CONTURA G2 RDS

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Mitutoyo Laser Scan micrometer

  • Non-contact laser-based measuring system, mainly for outside diameter measurement.
  • Accuracy of ±0.5μm in the ø0.1 – ø25mm range can be achieved. It is highly suitable suited for pin gage measurement.
  • Ultra-high repeatability of ±0.05μm.

Mitutoyo Laser Scan micrometer

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