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Quality & Inspection

Carl Zeiss Spectrum CMM
- RDS C5 Probe system
- Full feature graphic measurement
- Accuracy up to (1.8 + L/300) μm
- Calypso 2016 measurement software
Carl Zeiss Spectrum CMM

Carl Zeiss O INSPECT
- Scanning probe
- Optical camera system
- Full feature graphic measurement
- Accuracy up to (1.8 + L/300) μm
- Calypso 2018 measurement software
Carl Zeiss O INSPECT

Optomech Vpp-3020 CNC X2
- Full Inspection reports
- Advance SPC software
- Auto focus & Control of Len’s lighting
- Measurement of depths
- Measuring accuracy (3+L/100) Microns
- SPC report generator and monitoring
Optomech Vpp-3020 CNC x 2

Carl Zeiss Surfcom Flex 50A
- Instant Surface finish measurement
- Skid less and the highest straightness accuracy
- Precise & accurate
- Measurement target 0 – 200MM
- Sits on anti Vibration table
Carl Zeiss Surfcom Flex 50A

TRIMOS V3 Height gauge x 2
- Measuring ranges 400 and 700 mm
- Electronically adjustable measuring force
- USB Interface
- Complete probe kit
TRIMOS V3 Height gauge x 2

Keyence IM 7020
- Automatic recognition of part position and orientation
- Fast measurement (multiple parts simultaneously in seconds)
- Wide range of applications and GD&T tools
- Versatile programming for in-process and final inspections
- Accurate and repeatable measurements
- Ability to record results and create inspection report
- Depth probe
Keyence IM 7020

Surfcom Nex – Contour Tracer
- Best-in-class residual noise (Rz 0) thanks to a low-vibration linear drive
- Resolution of up to 0.1 nm at a 6.4 µm range and 20 nm at a 1,000 µm range
- With the optional tracing driver tilting unit it is possible to manually tilt the tracing driver +/-5 degrees
Surfcom Nex – Contour Tracer

ZEISS CONTURA G2 RDS
- scanning of features in all angular positions with VAST XXT on the flexible ZEISS RDS articulating probe
ZEISS CONTURA G2 RDS

Mitutoyo Laser Scan micrometer
- Non-contact laser-based measuring system, mainly for outside diameter measurement.
- Accuracy of ±0.5μm in the ø0.1 – ø25mm range can be achieved. It is highly suitable suited for pin gage measurement.
- Ultra-high repeatability of ±0.05μm.